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 FUJITSU SEMICONDUCTOR DATA SHEET
DS05-20903-1E
FLASH MEMORY
CMOS
64 M (4M x 16) BIT
MirrorFlashTM
MBM29PL65LM-90/10
s DESCRIPTION
MBM29PL65LM is of 67,108,864 bit capacity +3.0 V -only Flash memory enabling word write, both across- the chip, comprehensive erase and by-the-unit, individual sector erase. Its CMOS peripheral circuitry contributes to significant saving in power consumption even at high-speed standby mode operation. MBM29PL65LM consists of 4M x 16 bit Word mode and erases 128 sectors at ever 32K word. Its package type is 48-pin TSOP . Embedded Program AlgorithmTM, when executed with erase or program command sequences, automatically times the program pulse widths and verifies proper cell margin. MBM29PL65LM, because of its capability in electrical data erase and program through write command, enables to rewrite data within the internal system. It is a truly dependable device for vast application possibilities.
s PRODUCT LINE UP
Part No. VCC VCCQ Max Address Access Time Max CE Access Time Max Page Read Access Time MBM29PL65LM-90 3.0 V to 3.6 V VCC 90 ns 90 ns 25 ns MBM29PL65LM-10 3.0 V to 3.6 V VCC 100 ns 100 ns 30 ns
s PACKAGE
48-pin plastic TSOP (1) Marking Side
(FPT-48P-M19)
Notes: Programming in byte mode ( x 8) is prohibited. Programming to the address that already contains data is prohibited. (It is mandatory to erase data prior to overprogram on the same address.
MBM29PL65LM-90/10
s FEATURES
* * * * * * * * MirrorFlash MemoryTM*1 0.23 m Process Technology 4 M x 16 bit configuration Single 3.0 V read, program and erase Standard 48-pin TSOP (1) (Package suffix : TN) Minimum 100,000 program/erase cycles High performance Page mode (4 words) Sector erase architecture (Sectors can be grouped in any given combination.) 32K word sectors Any combination of sectors can be concurrently erased. Also supports full chip erase. HiddenROM Region Write Protect by WP pin Embedded EraseTM*2 Algorithms Embedded ProgramTM*2 Algorithms Data Polling and Toggle Bit feature for detection of program or erase cycle completion Automatic sleep mode Erase Suspend/Resume Low VCC write inhibit Sector Group Protection Extended Sector Group Protection Fast Program Temporary sector group unprotection In accordance with CFI (Common Flash Memory Interface)
* * * * * * * * * * * * *
*1 : MirrorFlashTM is a trademark of Fujitsu Limited. *2 : Embedded EraseTM and Embedded ProgramTM are trademarks of Advanced Micro Devices, Inc.
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MBM29PL65LM-90/10
s PIN ASSIGNMENT
TSOP(1) A15 A14 A13 A12 A11 A10 A9 A8 A21 A20 WE RESET ACC WP A19 A18 A17 A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 (Marking Side) 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 A16 VCCQ VSS DQ15 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE VSS CE A0
( FPT-48P-M19 )
s PIN DESCRIPTIONS
Pin Name A21 to A0 DQ15 to DQ0 CE OE WE WP ACC RESET VCC VCCQ VSS Address Inputs Data Inputs/Outputs Chip Enable Output Enable Write Enable Hardware Write Protection Hardware Program Acceleration Hardware Reset Pin/Temporary Sector Group Unprotection Device Power Supply Output Power Supply Device Ground Function
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MBM29PL65LM-90/10
s BLOCK DIAGRAM
DQ15 to DQ0
VCC VSS VCCQ
Erase Voltage Generator
Input/Output Buffers
WE RESET WP ACC
State Control
Command Register
Program Voltage Generator
CE OE
Chip Enable Output Enable Logic
STB
Data Latch
STB
Y-Decoder
Y-Gating
Timer for Program/Erase A21 to A2
Address Latch
X-Decoder
Cell Matrix
A1, A0
s LOGIC SYMBOL
22 A21 to A0 DQ 15 to DQ 0 CE OE WE WP ACC RESET 16
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MBM29PL65LM-90/10
s DEVICE BUS OPERATION
MBM29PL65LM User Bus Operations Table Operation Standby Autoselect Manufacture Code* Autoselect Device Code*1 Read Output Disable Write (Program/Erase) Enable Sector Group Protection*2 Temporary Sector Group Unprotection Reset (Hardware) Sector Write Protection*
3 1
CE OE WE A0 H L L L L L L X X X X L L L H H H X X X X H H H H L L X X X X L H A0 X A0 L X X X
A1 X L L A1 X A1 H X X X
A2 X L L A2 X A2 L X X X
A3 X L L A3 X A3 L X X X
A6 X L L A6 X A6 L X X X
A9 DQ15 to DQ0 RESET WP X VID VID A9 X A9 X X X X Hi-Z Code Code DOUT Hi-Z *4 *4 *4 Hi-Z X H H H H H H VID VID L H X X X X X *5 H H X L
Legend : L = VIL, H = VIH, X = VIL or VIH. See DC Characteristics for voltage levels. Hi-Z = High-Z, VID = 11.5 V to 12.5 V *1 : Manufacturer and device codes may also be accessed via a command register write sequence. See "MBM29PL65LM Standard Command Definitions". *2 : Refer to Sector Group Protection. *3 : Protects the first 32K words sector (SA0). *4 : DIN or DOUT as required by command sequence, data pulling, or sector protect algorithm *5 : If WP/ACC = VIL, the first sector remains protected. If WP/ACC = VIH, the first sector will be protected or unprotected as determined by the method specified in "Sector Group Protection" in "s FUNCTIONAL DESCRIPTION".
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MBM29PL65LM Standard Command Definitions Table*1 Command Sequence Reset* Reset*
2 2
Bus Write Cycles Req'd
First Bus Second Bus Third Bus Write Write Write Cycle Cycle Cycle
Addr Data Addr XXXh 555h 555h 555h 555h 555h F0h -- Data -- 55h 55h 55h 55h 55h -- -- 55h PD Addr Data -- 555h 555h 555h 555h 555h -- -- 555h -- -- SA -- 555h SGA -- 555h 555h 555h -- F0h 90h A0h 80h 80h -- -- 20h -- -- 25h -- F0h 40h -- 88h A0h 90h
Fourth Bus Read/Write Cycle
Addr -- RA*
13
Fifth Bus Sixth Bus Write Write Cycle Cycle
Addr Data Addr Data -- -- -- -- -- -- -- -- -- -- -- -- --
Data -- RD*
13
1 3 3 4 6 6
3
AAh 2AAh AAh 2AAh AAh 2AAh AAh 2AAh AAh 2AAh -- --
-- -- --
Autoselect Program Chip Erase Sector Erase Program/Erase Suspend* Program/Erase Resume* Set to Fast Mode* Fast Program* Write to Buffer Program Buffer to Flash (Confirm) Write to Buffer Abort Reset*6 Extended Sector Group Protection*7,*8 Query*9 HiddenROM Entry* HiddenROM Exit*11 RA PA
10 10, 11 4 4 3
00h*13 PA 555h 555h -- -- -- -- -- SA -- -- SGA*13 -- -- PA XXXh
04h*13 PD AAh AAh -- -- -- -- -- 0Fh -- -- SD*13 -- -- PD 00h
2AAh 55h 555h 10h 2AAh 55h -- -- -- -- -- PA -- -- -- -- -- -- -- -- -- -- -- -- PD -- -- -- -- -- -- -- SA -- -- -- -- -- WBL -- -- -- -- -- -- -- 30h -- -- -- -- -- PD -- -- -- -- -- -- --
1 1 3 2 2 20 1 3 4 1 3 4 4
XXXh B0h XXXh 555h 30h
AAh 2AAh PA
XXXh A0h XXXh 555h SA 555h XXXh 55h 555h 555h 555h
Reset from Fast Mode*5
90h XXXh 00h*12 AAh 2AAh 29h -- 55h -- 55h 60h -- 55h 55h 55h
AAh 2AAh 60h 98h SGA --
AAh 2AAh AAh 2AAh AAh 2AAh
HiddenROM Program * *
= Address of the memory location to be read. = Address of the memory location to be programmed Addresses are latched on the falling edge of the write pulse. SA = Address of the sector to be erased. The combination of A21, A20, A19, A18, A17, A16 and A15 will uniquely select any sector. See "Sector Address Table" SGA = Sector Group Address to be protected. See "Sector Group Address Table". Specify SGA which constitutes from A21 to A17 and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0). RD = Data read from location RA during read operation. PD = Data to be programmed at location PA. Data is latched on the rising edge of write pulse. WBL = Write Buffer Location HRA = Address of the HiddenROM area ; 000000h to 00007Fh
*1 : The command combinations not described in "MBM29PL65LM Standard Command Definitions" are illegal. *2 : Both of these reset commands are equivalent except for "Write to Buffer Abort" reset. *3 : The Erase Suspend and Erase Resume command are valid only during a sector erase operation. *4 : The Set to Fast Mode command is required prior to the Fast Program command. *5 : The Reset from Fast Mode command is required to return to the read mode when the device is in fast mode. 6
MBM29PL65LM-90/10
*6 : Reset to the read mode. The Write to Buffer Abort Reset command is required after the Write to Buffer operation was aborted. *7 : This command is valid while RESET = VID. *8 : Sector Group Address (SGA) with A6 = 0, A3 = 0, A2 = 0, A1 = 1, and A0 = 0 *9 : The valid address are A6 to A0. *10 : The HiddenROM Entry command is required prior to the HiddenROM programming. *11 : This command is valid during HiddenROM mode. *12 : The data "F0h" is also acceptable. *13 : Indicates read cycle. Notes : * X = "H" or "L" * Bus operations are defined in "User Bus Operations Table".
Autoselect Codes Table Type Manufacturer's Code Device Code Extended Device Code*1 X Sector Group Protection*3 Sector Group Address VIL VIL VIH VIL VIH VIL VIH VIH VIH VIL 2201h *2 A21 to A17 X X X A6 VIL VIL VIL A3 VIL VIL VIH A2 VIL VIL VIH A1 VIL VIL VIH A0 VIL VIH VIL Code (HEX) 04h 227Eh 2213h
*1 : At Word mode, a read cycle at address 01h outputs device code. When 227Eh is output, it indicates that reading two additional codes, called Extended Device Codes, will be required. Therefore the system may continue reading out these Extended Device Codes at the address of 0Eh, as well as at 0Fh. *2 : Outputs 01h at protected sector group addresses and outputs 00h at unprotected sector group addresses. *3 : Given CE = Fix, wait for one cycle after the rising edge of WE (the last write command), then indicate SGA as (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0).
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MBM29PL65LM-90/10
Sector Address Table
Sector SA0 SA1 SA2 SA3 SA4 SA5 SA6 SA7 SA8 SA9 SA10 SA11 SA12 SA13 SA14 SA15 SA16 SA17 SA18 SA19 SA20 SA21 SA22 SA23 SA24 SA25 SA26 SA27 SA28 SA29 SA30 A21 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 A20 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 A19 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 A18 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 A17 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 A16 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 A15 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 Sector Size (Kwords) 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 Address Range 000000h to 007FFFh 008000h to 00FFFFh 010000h to 017FFFh 018000h to 01FFFFh 020000h to 027FFFh 028000h to 02FFFFh 030000h to 037FFFh 038000h to 03FFFFh 040000h to 047FFFh 048000h to 04FFFFh 050000h to 057FFFh 058000h to 05FFFFh 060000h to 067FFFh 068000h to 06FFFFh 070000h to 077FFFh 078000h to 07FFFFh 080000h to 087FFFh 088000h to 08FFFFh 090000h to 097FFFh 098000h to 09FFFFh 0A0000h to 0A7FFFh 0A8000h to 0AFFFFh 0B0000h to 0B7FFFh 0B8000h to 0BFFFFh 0C0000h to 0C7FFFh 0C8000h to 0CFFFFh 0D0000h to 0D7FFFh 0D8000h to 0DFFFFh 0E0000h to 0E7FFFh 0E8000h to 0EFFFFh 0F0000h to 0F7FFFh
(Continued)
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MBM29PL65LM-90/10
Sector SA31 SA32 SA33 SA34 SA35 SA36 SA37 SA38 SA39 SA40 SA41 SA42 SA43 SA44 SA45 SA46 SA47 SA48 SA49 SA50 SA51 SA52 SA53 SA54 SA55 SA56 SA57 SA58 SA59 SA60 SA61 SA62
A21 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
A20 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
A19 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
A18 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1
A17 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1
A16 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1
A15 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0
Sector Size (Kwords) 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32
Address Range 0F8000h to 0FFFFFh 100000h to 107FFFh 108000h to 10FFFFh 110000h to 117FFFh 118000h to 11FFFFh 120000h to 127FFFh 128000h to 12FFFFh 130000h to 137FFFh 138000h to 13FFFFh 140000h to 147FFFh 148000h to 14FFFFh 150000h to 157FFFh 158000h to 15FFFFh 160000h to 167FFFh 168000h to 16FFFFh 170000h to 177FFFh 178000h to 17FFFFh 180000h to 187FFFh 188000h to 18FFFFh 190000h to 197FFFh 198000h to 19FFFFh 1A0000h to 1A7FFFh 1A8000h to 1AFFFFh 1B0000h to 1B7FFFh 1B8000h to 1BFFFFh 1C0000h to 1C7FFFh 1C8000h to 1CFFFFh 1D0000h to 1D7FFFh 1D8000h to 1DFFFFh 1E0000h to 1E7FFFh 1E8000h to 1EFFFFh 1F0000h to 1F7FFFh
(Continued)
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Sector SA63 SA64 SA65 SA66 SA67 SA68 SA69 SA70 SA71 SA72 SA73 SA74 SA75 SA76 SA77 SA78 SA79 SA80 SA81 SA82 SA83 SA84 SA85 SA86 SA87 SA88 SA89 SA90 SA91 SA92 SA93 SA94
A21 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
A20 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
A19 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
A18 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1
A17 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1
A16 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1
A15 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0
Sector Size (Kwords) 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32
Address Range 1F8000h to 1FFFFFh 200000h to 207FFFh 208000h to 20FFFFh 210000h to 217FFFh 218000h to 21FFFFh 220000h to 227FFFh 228000h to 22FFFFh 230000h to 237FFFh 238000h to 23FFFFh 240000h to 247FFFh 248000h to 24FFFFh 250000h to 257FFFh 258000h to 25FFFFh 260000h to 267FFFh 268000h to 26FFFFh 270000h to 277FFFh 278000h to 27FFFFh 280000h to 287FFFh 288000h to 28FFFFh 290000h to 297FFFh 298000h to 29FFFFh 2A0000h to 2A7FFFh 2A8000h to 2AFFFFh 2B0000h to 2B7FFFh 2B8000h to 2BFFFFh 2C0000h to 2C7FFFh 2C8000h to 2CFFFFh 2D0000h to 2D7FFFh 2D8000h to 2DFFFFh 2E0000h to 2EE7FFh 2E8000h to 2EFFFFh 2F0000h to 2F7FFFh
(Continued)
10
MBM29PL65LM-90/10
(Continued)
Sector SA95 SA96 SA97 SA98 SA99 SA100 SA101 SA102 SA103 SA104 SA105 SA106 SA107 SA108 SA109 SA110 SA111 SA112 SA113 SA114 SA115 SA116 SA117 SA118 SA119 SA120 SA121 SA122 SA123 SA124 SA125 SA126 SA127 A21 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 A20 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 A19 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 A18 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 A17 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 A16 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 A15 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 Sector Size (Kwords) 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 32 Address Range 2F8000h to 2FFFFFh 300000h to 307FFFh 308000h to 30FFFFh 310000h to 317FFFh 318000h to 31FFFFh 320000h to 327FFFh 328000h to 32FFFFh 330000h to 337FFFh 338000h to 33FFFFh 340000h to 347FFFh 348000h to 34FFFFh 350000h to 357FFFh 358000h to 35FFFFh 360000h to 367FFFh 368000h to 36FFFFh 370000h to 377FFFh 378000h to 37FFFFh 380000h to 387FFFh 388000h to 38FFFFh 390000h to 397FFFh 398000h to 39FFFFh 3A0000h to 3A7FFFh 3A8000h to 3AFFFFh 3B0000h to 3B7FFFh 3B8000h to 3BFFFFh 3C0000h to 3C7FFFh 3C8000h to 3CFFFFh 3D0000h to 3D7FFFh 3D8000h to 3DFFFFh 3E0000h to 3E7FFFh 3E8000h to 3EFFFFh 3F0000h to 3F7FFFh 3F8000h to 3FFFFFh
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MBM29PL65LM-90/10
Sector Group Address Table Sector Group Address SGA0 SGA1 SGA2 SGA3 SGA4 SGA5 SGA6 SGA7 SGA8 SGA9 SGA10 SGA11 SGA12 SGA13 SGA14 SGA15 SGA16 SGA17 SGA18 SGA19 SGA20 SGA21 SGA22 SGA23 SGA24 SGA25 SGA26 SGA27 SGA28 SGA29 SGA30 SGA31 A21 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 A20 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 A19 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 A18 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 A17 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 Sector Group Size (Kwords) 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 128 Sectors SA0 to SA3 SA4 to SA7 SA8 to SA11 SA12 to SA15 SA16 to SA19 SA20 to SA23 SA24 to SA27 SA28 to SA31 SA32 to SA35 SA36 to SA39 SA40 to SA43 SA44 to SA47 SA48 to SA51 SA52 to SA55 SA56 to SA59 SA60 to SA63 SA64 to SA67 SA68 to SA71 SA72 to SA75 SA76 to SA79 SA80 to SA83 SA84 to SA87 SA88 to SA91 SA92 to SA95 SA96 to SA99 SA100 to SA103 SA104 to SA107 SA108 to SA111 SA112 to SA115 SA116 to SA119 SA120 to SA123 SA124 to SA127
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MBM29PL65LM-90/10
Common Flash Memory Interface Code Table DQ15 to DQ0 Description 0051h 0052h Query-unique ASCII string "QRY" 0059h 0002h Primary OEM Command Set 0000h 02h : AMD/FJ standard 0040h Address for Primary Extended Table 0000h 0000h Alternate OEM Command Set 0000h (00h = not applicable) 0000h Address for Alternate OEM Extended Table 0000h VCC Min (write/erase) 0027h DQ7 to DQ4: 1V/bit, DQ3 to DQ0: 100 mV/bit VCC Max (write/erase) 0036h DQ7 to DQ4: 1V/bit, DQ3 to DQ0: 100 mV/bit 0000h VPP Min voltage (00h = no Vpp pin) 0000h VPP Max voltage (00h =no Vpp pin) 0007h Typical timeout per single write 2N s 0007h Typical timeout for Min size buffer write 2N s 000Ah Typical timeout per individual sector erase 2N ms 0000h Typical timeout for full chip erase 2N ms 0001h Max timeout for write 2N times typical 0005h Max timeout for buffer write 2N times typical 0004h Max timeout per individual sector erase 2N times typical 0000h Max timeout for full chip erase 2N times typical 0017h Device Size = 2N byte 0001h Flash Device Interface description 0000h 01h : x 16 0005h Max number of byte in multi-byte write = 2N 0000h 0001h Number of Erase Block Regions within device (02h = Boot) 007Fh Erase Block Region 1 Information 0000h bit 15 to bit 0 : y = number of sectors 0000h bit 31 to bit 16 : z = size 0001h (z x 256 Byte) 0000h Erase Block Region 2 Information 0000h bit 15 to bit 0 : y = number of sectors 0000h bit 31 to bit 16 : z = size 0000h (z x 256 Byte)
A6 to A0 10h 11h 12h 13h 14h 15h 16h 17h 18h 19h 1Ah 1Bh
1Ch 1Dh 1Eh 1Fh 20h 21h 22h 23h 24h 25h 26h 27h 28h 29h 2Ah 2Bh 2Ch 2Dh 2Eh 2Fh 30h 31h 32h 33h 34h
(Continued)
13
MBM29PL65LM-90/10
(Continued) A6 to A0 35h 36h 37h 38h 39h 3Ah 3Bh 3Ch 40h 41h 42h 43h 44h
45h 46h 47h
DQ15 to DQ0 0000h 0000h 0000h 0000h 0000h 0000h 0000h 0000h 0050h 0052h 0049h 0031h 0033h 0008h 0002h 0004h
Description Erase Block Region 3 Information bit 15 to bit 0 : y = number of sectors bit 31 to bit 16 : z = size (z x 256 Byte) Erase Block Region 4 Information bit 15 to bit 0 : y = number of sectors bit 31 to bit 16 : z = size (z x 256 Byte) Query-unique ASCII string "PRI" Major version number, ASCII Minor version number, ASCII Address Sensitive Unlock 08h : Supported 09h : Not Supported Erase Suspend (02h = To Read & Write) Sector Group Protection 00h : Not Supported X : Number of sectors in per group Sector Temporary Unprotection 00h : Not Supported 01h : Supported Sector Group Protection Algorithm Dual Operation (00h = Not Supported) Burst Mode Type (00h = Not Supported) Page Mode Type (01h = 4-Word Page Supported) VACC (Acceleration) Supply Minimum 00h = Not Supported DQ7 to DQ4: 1V/bit, DQ3 to DQ0: 100mV/bit VACC (Acceleration) Supply Maximum 00h = Not Supported DQ7 to DQ4: 1V/bit, DQ3 to DQ0: 100mV/bit Write Protect 04h = Uniform Sectors Bottom Write Protect Program Suspend 00h = Not Supported 01h = Supported
48h 49h 4Ah 4Bh 4Ch
0001h 0004h 0000h 0000h 0001h
4Dh
00B5h
4Eh
00C5h
4Fh 50h
0004h 01h
14
MBM29PL65LM-90/10
s FUNCTIONAL DESCRIPTION
Standby Mode There are two ways to implement the standby mode on the device, one using both the CE and RESET pins, and the other via the RESET pin only. When using both pins, CMOS standby mode is achieved with CE and RESET input held at VCC 0.3 V. Under this condition the current consumed is less than 5 A Max. During Embedded Algorithm operation, VCC active current (ICC2) is required even when CE = "H". The device can be read with standard access time (tCE) from either of these standby modes. When using the RESET pin only, CMOS standby mode is achieved with RESET input held at VSS 0.3 V (CE = "H" or "L") . Under this condition the current consumed is less than 5 A Max. Once the RESET pin is set high, the device requires tRH as a wake-up time for output to be valid for read access. During standby mode, the output is in the high impedance state regardless of OE input. Automatic Sleep Mode Automatic sleep mode works to resin power consumption during read-out of the device data. This is useful in the application such as a handy terminal which requires low power consumption. To activate this mode, the device automatically switches itself to low power mode when address remain stable during access time of tACC + 30 ns. It is not necessary to control CE, WE and OE on this mode. The current consumed is typically 1 A (CMOS Level) . During simultaneous operation, VCC active current (ICC2) is required. Since, the data are latched during this mode, the data are continuously read out. When the addresses are changed, the mode is automatically canceled and the device reads the data for changed address. Autoselect Autoselect mode allows reading out of a binary code and identifies its manufacturer and type. It is intended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. This mode is functional over the entire temperature range of the device. To activate this mode, the programming equipment must force VID on address pin A9. Three identifier bytes may then be sequenced from the device outputs by toggling addresses. All addresses are DON'T CARES except A6 to A0. The manufacturer and device codes may also be read via the command register, for instances when the device is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in "Common Definitions Table" of "s DEVICE BUS OPERATIONS". A read cycle from address 00h returns the manufacturer's code (Fujitsu = 04h) . A read cycle from address 01h outputs device code. At word mode, 227Eh is output, it indicates that two additional codes, called Extended Device Codes is required. Therefore the system may continue reading out these Extended Device Codes at addresses of 0Eh and 0Fh. Refer to "Autoselect Codes Table" in "s DEVICE BUS OPERATIONS". Read Mode The device has two control functions required to obtain data at the outputs. CE is the power control and used for a device selection. OE is the output control and used to gate data to the output pins if a device is selected. Address access time (tACC) is equal to the delay from stable addresses to valid output data. The chip enable access time (tCE) is the delay from stable addresses and stable CE to valid data at the output pins. The output enable access time is the delay from the falling edge of OE to valid data at the output pins. Assuming the addresses have been stable for at least tACC - tOE time. When reading out a data without changing addresses after power-up, input hardware reset or to change CE pin from "H" or "L". 15
MBM29PL65LM-90/10
Page Mode Read The device is capable of fast Page mode read and are compatible with Page mode Mask ROM read operation. This mode provides faster read access speed for random locations within a page. Page size is 4 words, within the appropriate Page being selected by the higher address bits A21 to A2 and the address bits A1 to A0 in Word mode (A1 to A-1 in Byte mode). The initial page access is equal to the random access (tACC) and subsequent Page read access (as long as the locations specified by the microprocessor fall within that Page) is equivalent to the page access time (tPACC). Output Disable With the OE input is at logic high level (VIH), output from the device is disabled. This causes the output pins to be in a high impedance state. Write Device erase and programming are accomplished via the command register. The contents of the register serve as input to the internal state machine. The state machine output dictates the device function. The command register itself does not occupy any addressable memory location. The register is a latch used to store the commands, along with the address and data information needed to execute the command. The command register is written by bringing WE to VIL, while CE is at VIL and OE is at VIH. Addresses are latched on the falling edge of WE or CE, whichever starts later, while data is latched on the rising edge of WE or CE, whichever starts first. Standard microprocessor write timings are used. Refer to AC Write Characteristics and the Erase/Programming Waveforms for specific timing parameters. Sector Group Protection The device features hardware sector group protection. This feature will disable both program and erase operations in any combination of 32 sector groups of memory. See "Sector Group Address Table (MBM29PL65LM)" in "s DEVICE BUS OPERATION". The user's side can use the sector group protection using programming equipment. The device is shipped with all sector groups that are unprotected. To activate it, the programming equipment must force VID on address pin A9 and control pin OE, CE = VIL and A6 = A3 = A2 = A0 = VIL, A1 = VIH. The sector group addresses (A21, A20, A19, A18, and A17) should be set to the sector to be protected. "Sector Address Table (MBM29PL65LM)" in "s DEVICE BUS OPERATION" defines the sector address for each of the seventy-one (71) individual sectors, and "Sector Group Address Table (MBM29PL65LM)" in "s DEVICE BUS OPERATION" defines the sector group address for each of the twentyfour (24) individual group sectors. Programming of the protection circuitry begins on the falling edge of the WE pulse and is terminated with the rising edge of the same. Sector group addresses must be held constant during the WE pulse. See "Sector Group Protection Timing Diagram" in "s TIMING DIAGRAM" and "Sector Group Protection Algorithm" in "s FLOW CHART" for sector group protection timing diagram and algorithm. To verify programming of the protection circuitry, the programming equipment must force VID on address pin A9 with CE and OE at VIL and WE at VIH. Scanning the sector group addresses (A21, A20, A19, A18 and A17) while (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) will produce a logical "1" code at device output DQ0 for a protected sector. Otherwise the device will produce "0" for unprotected sectors. In this mode, the lower order addresses, except for A0, A1, A2, A3 and A6 can be either High or Low. Where the high order addresses (A21, A20, A19, A18 and A17) are the desired sector group address will produce a logical "1" at DQ0 for a protected sector group. See "Sector Group Protection Verify Autoselect Codes" in "s DEVICE BUS OPERATION" for Autoselect codes. Temporary Sector Group Unprotection This feature allows temporary unprotection of previously protected sector groups of the devices in order to change data. The Sector Group Unprotection mode is activated by setting the RESET pin to high voltage (VID). During this mode, formerly protected sector groups can be programmed or erased by selecting the sector group addresses. Once the VID is taken away from the RESET pin, all the previously protected sector groups will be 16
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protected again. Refer to "Temporary Sector Group Unprotection Timing Diagram" in s SWITCHING WAVEFORMS and "Temporary Sector Group Unprotection Algorithm" in s FLOW CHART. Hardware Reset The device may be reset by driving the RESET pin to VIL. The RESET pin has a pulse requirement and has to be kept low (VIL) for at least "tRP" in order to properly reset the internal state machine. Any operation in the process of being executed is terminated and the internal state machine is reset to the read mode "tREADY" after the RESET pin is driven low. Furthermore once the RESET pin goes high the device requires an additional "tRH" before it allows read access. When the RESET pin is low, the device is in the standby mode for the duration of the pulse and all the data output pins are tri-stated. If a hardware reset occurs during a program or erase operation, the data at that particular location are corrupted. Write Protect (WP) Aside from Sector Group Protection, MBM29PL65LM provides another function that protects the first sector (SA0) during programming and erase. When WP = VIL, this first sector (SA0) becomes protected while Sector Group Protection for all the other sectors are temporarily lifted. Accelerated Program Operation The device offers accelerated program operation which enables the programming in high speed. If the system asserts VACC to the ACC pin, the device automatically enters the acceleration mode and the time required for program operation will reduce to about 85%. This function is primarily intended to allow high speed program, so caution is needed as the sector group becomes temporarily unprotected. The system uses fast program command sequence when programming during acceleration mode. Set command to fast mode and reset command from fast mode are not necessary. When the device enters the acceleration mode, the device automatically set to fast mode. Therefore the present sequence is used for programming and detection of completion during acceleration mode. Removing VACC from the ACC pin and applying VIL or VIH returns the device to normal operation. Do not remove VACC from ACC pin while programming. See "Accelerated Program Timing Diagram". VCCQ The output voltage generated on the device is determined based on the VCCQ level. This feature allows the device to operate in mixed-voltage environments, driving and receiving signals to and from other devices on the same bus.
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s COMMAND DEFINITIONS
Device operations are selected by writing specific address and data sequences into the command register. "MBM29PL65LM Command Definitions Table" in s DEVICE BUS OPERATION shows the valid register command sequences. Note that the Erase Suspend (B0h) and Erase Resume (30h) commands are valid only while the Sector Erase operation is in progress. Also the Program Suspend (B0h) and Program Resume (30h) commands are valid only while the Program operation is in progress. Moreover, Read/Reset commands are functionally equivalent, resetting the device to the read mode. Please note that commands are always written at DQ7 to DQ0 and DQ15 to DQ8 bits are ignored. Reset Command In order to return from Autoselect mode or Exceeded Timing Limits (DQ5 = 1) to Reset mode, verify mode of secter protect commands, the Read/Reset operation is initiated by writing the Read/Reset command sequence into the command register. Microprocessor read cycles retrieve array data from the memory. The device remains enabled for reads until the command register contents are altered. The device automatically powers-up in the Read/Reset state. In this case, a command sequence is not required to read data. Standard microprocessor read cycles retrieve array data. This default value ensures that no spurious alteration of the memory content occurs during the power transition. Refer to the AC Read Characteristics and Waveforms for specific timing parameters. Autoselect Command Flash memories are intended for use in applications where the local CPU alters memory contents. Therefore manufacture and device codes must be accessible while the device resides in the target system. PROM programmers typically access the signature codes by raising A9 to a higher voltage. However multiplexing high voltage onto the address lines is not generally desired system design practice. he device contains Autoselect command operation to supplement traditional PROM programming methodology. The operation is initiated by writing the Autoselect command sequence into the command register. This is followed by a third write cycle that contains the address and the Autoselect command. Then the manufacture and device codes can be read from the address, and an actual data of memory cell can be read from the another address. Following the command write, a read cycle from address 00h returns the manufacturer's code (Fujitsu=04h). And, at double word mode, a read cycle at address 01h outputs device code. At word mode, 227Eh is output, this indicates that two additional codes, called Extended Device Codes will be required. Therefore the system may continue reading out these Extended Device Codes at the address of 0Eh, as well as at (BA) 0Fh (at word mode, 1Eh). Refer to "MBM29PL65LX Autoselect Codes Table" in s DEVICE BUS OPERATION. To terminate the operation, it is necessary to write the Reset command sequence into the register. To execute the Autoselect command during the operation, Reset command sequence must be written before the Autoselect command. Program Command The device is programmed on word-by-word basis (or double word-by-double word). Programming is a four bus cycle operation. There are two "unlock" write cycles. These are followed by the program set-up command and data write cycles. Addresses are latched on the falling edge of CE or WE, whichever happens later, and the data is latched on the rising edge of CE or WE, whichever happens first. The rising edge of CE or WE (whichever happens first) starts programming. Upon executing the Embedded Program Algorithm command sequence, the system is not required to provide further controls or timings. The device automatically provides adequate internally generated program pulses and verify programmed cell margin. The system can determine the status of the program operation by using DQ7 (Data Polling), DQ6 (Toggle Bit) or RY/BY. The Data Polling and Toggle Bit are automatically performed at the memory location being programmed.
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The programming operation is completed when the data on DQ7 is equivalent to data written to this bit at which the devices return to the read mode and plogram addresses are no longer latched. Therefore, the devices require that a valid address to the devices be supplied by the system at this particular instance. Hence Data Polling requires the same address which is being programmed. If hardware reset occurs during the programming operation, the data being written is not guaranteed. Programming is allowed in any sequence and across sector boundaries. Beware that a data "0" cannot be programmed back to a "1". Attempting to do so may either hang up the device or result in an apparent success according to the data polling algorithm but a read from Reset mode will show that the data is still "0". Only erase operations can convert from "0"s to "1"s.Refer to "Embedded ProgramTM Algorithm" using typical command strings and bus operations. Program Suspend/Resume Command The Program Suspend command allows the system to interrupt a program operation so that data can be read from any address. Writing the Program Suspend command (B0h) during the Embedded Program operation immediately suspends the programming. The bank addresses of sector being programmed should be set when writing the Program Suspend command. When the Program Suspend command is written during a programming process, the device halts the program operation within 1 s and updates the status bits. After the program operation has been suspended, the system can read data from any address. The data at program-suspended address is not valid. Normal read timing and command definitions apply. After the Program Resume command (30h) is written, the device reverts to programming. The bank addresses of sectors being suspended should be set when writing the Program Resume command. The system can determine the program operation status using the DQ7 or DQ6 status bits, just as in the standard program operation. See "Write Operation Status" for more information. When issuing program suspend command in 4 s after issuing program command, determine the status of program operation by reading status bit at more 4 s after issuing program resume command. The system may also write the Autoselect command sequence in the Program Suspend mode. The device allows reading Autoselect codes at the addresses within programming sectors, since the codes are not stored in the memory. When the device exits from the Autoselect mode, the device reverts to the Program Suspend mode, and is ready for another valid operation. See "Autoselect Command Sequence" for more information. The system must write the Program Resume command to exit from the Program Suspend mode and continue programming operation. Further writes of the Resume command are ignored. Another Program Suspend command can be written after the device resumes programming. Do not read CFI code after HiddenROM Entry and Exit in program suspend mode. Write Buffer Programming Operations Write Buffer Programming allows the system write to series of 16 words in one programming operation. This results in faster effective word programming time than the standard programming algorithms. The Write Buffer Programming command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle selecting the Sector Address in which programming will occur. In forth cycle contains both Sector Address and unique code for data bus width will be loaded into the page buffer at the Sector Address in which programming will occur. The system then writes the starting address/data combination. This "starting address" must be the same Sector Address used in third and fourth cycles and its lower addresses of A3 to A0 should be 0h. All subsequent address must be incremented by 1. Addresses are latched on the falling edge of CE or WE, whichever happens later and the data is latched on the rising edge of CE or WE, whichever happens first. The rising edge of CE or WE (whichever happens first) starts programming. Upon executing the Write Buffer Programming Operations com-
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mand sequence, the system is not required to provide further controls or timings. The device will automatically provide adequate internally generated program pulses and verify the programmed cell margin. DQ7(Data Polling), DQ6(Toggle Bit), DQ5(Exceeded Timing Limits), DQ1(Write-to-Buffer Abort) should be monitored to determine the device status during Write Buffer Programming. In addition to these functions, it is also possible to indicate to the host system that Write Buffer Programming Operations are either in progress or have been completed by RY/BY. See "Hardware Sequence Flags".The Data polling techniques described in "Data Polling Algorithm" in s FLOW CHART should be used while monitoring the last address location loaded into the write buffer. In addition, it is not neccessary to specify an address in Toggle Bit techniques described in "Toggle Bit Algorithm" in s FLOW CHART. The automatic programing operation is completed when the data on DQ7 is equivalent to the data written to this bit at which time the device returns to the read mode and addresses are no longer latched ( See "Hardware Sequence Flags"). The write-buffer programming operation can be suspended using the standard program suspend/resume commands. Once the write buffer programming is set, the system must then write the "Program Buffer to Flash" command at the Sector Address. Any other address/data combination will abort the Write Buffer Programming operation and the device will continue busy state. The Write Buffer Programming Sequence can be ABORTED by doing the following : * Different Sector Address is asserted. * Write data other than the "Program Buffer to Flash" command after the specified number of "data load" cycles. A "Write-to-Buffer-Abort Reset" command sequence must be written to the device to return to read mode. (See "MBM29PL65LM Standard Command Definitions" in s DEVICE BUS OPERATION for details on this command sequence.) Chip Erase Command Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command. Two more "unlock" write cycles are then followed by the chip erase command. Chip erase does not require the user to program prior to erase. Upon executing the Embedded Erase Algorithm command sequence the device automatically programs and verifies the entire memory for an all zero data pattern prior to electrical erase. (Preprogram Function) The system is not required to provide any controls or timings during these operations. The system can determine the erase operation status by using DQ7 (Data Polling), or DQ6 (Toggle Bit). The chip erase begins on the rising edge of the last CE or WE, whichever happens first in the command sequence and terminates when the data on DQ7 is "1" at which the device returns to read the mode. Chip Erase Time: Sector Erase Time x All sectors + Chip Program Time (Preprogramming) Refer to "Embedded EraseTM Algorithm" for typical command strings and bus operations. Sector Erase Command Sector erase is a six bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command. Two more "unlock" write cycles are then followed by the Sector Erase command. The sector address (any address location within the desired sector) is latched on the falling edge of CE or WE whichever starts later, while the command (Data = 30h) is latched on the rising edge of CE or WE whichever states first. After time-out of "tTOW" from the rising edge of the last sector erase command, the sector erase operation will begin. Multiple sectors are erased concurrently by writing the six bus cycle operations on "MBM29XL12DF Command Definitions Table" in s DEVICE BUS OPERATION. This sequence is followed with writes of the Sector Erase command to addresses in other sectors desired to be concurrently erased. The time between writes must be less than "tTOW" otherwise that command is not accepted and erasure does not start. It is recommended that processor interrupts be disabled during this time to guarantee this condition. The interrupts can be re-enabled after the last Sector Erase command is written. A time-out of "tTOW" from the rising edge of last CE or WE whichever starts first initiates the execution of the Sector Erase command(s). If another falling edge of CE or WE, whichever 20
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starts first occurs within the "tTOW" time-out window the timer is reset. (Monitor DQ3 to determine if the sector erase timer window is still open, see section DQ3, "Sector Erase Timer".) Any command other than Sector Erase or Erase Suspend during this time-out period will reset the device to the read mode, ignoring the previous command string. Resetting the device once execution has begun may corrupt the data in the sector. In that case restart the erase on those sectors and allow them to complete. Refer to "Write Operation Status" section for Sector Erase Timer operation. Loading the sector erase buffer may be done in any sequence and with any number of sectors. Sector erase does not require the user to program prior to erase. The device automatically programs all memory locations in the sector(s) to be erased prior to electrical erase (Preprogram function). When erasing a sector or sectors the remaining unselected sectors are not affected. The system is not required to provide any controls or timings during these operations. The system can determine the status of the erase operation by using DQ7 (Data Polling), or DQ6 (Toggle Bit). The sector erase begins after the "tTOW" time out from the rising edge of CE or WE whichever starts first for the last sector erase command pulse and terminates when the data on DQ7 is "1" at which time the device returns to the read mode. See "Write Operation Status" section. Data polling and Toggle Bit must be performed at an address within any of the sectors being erased. Multiple Sector Erase Time; [Sector Erase Time + Sector Program Time (Preprogramming)] x Number of Sector Erase. Erase Suspend/Resume Command The Erase Suspend command allows the user to interrupt Sector Erase operation and then perform read to a sector not being erased. This command is applicable ONLY during the Sector Erase operation within the timeout period for Sectore erase. Writting the Erase Suspend command (B0h) during the Sector Erase time-out results in immediate termination of the time-out period and suspension of the erase operation. Writing the Erase Resume command (30h) resumes the erase operation. When the "Erase Suspend" command is written during the Sector Erase operation, the device takes a maximum of "tSPD" to suspend the erase operation. When the devices have entered the erase-suspended mode, the RY/ BY output pin will be at High-Z and the DQ7 bit will be at logic "1" and DQ6 will stop toggling. The user must use the address of the erasing sector for reading DQ6 and DQ7 to determine if the erase operation has been suspended. Further writes of the Erase Suspend command are ignored. When the erase operation is suspended, the device defaults to the erase-suspend-read mode. Reading data in this mode is the same as reading from the standard read mode except that the data must be read from sectors that have not been erase-suspended. Successively reading from the erase-suspended sector while the device is in the erase-suspend-read mode causes DQ2 to toggle. See the section on DQ2. To resume the operation of Sector Erase, the Resume command (30h) should be written. Any further writes of the Resume command at this point is ignored. Another Erase Suspend command is written after the chip resumes erasing. Do not issuing program command after entering erase-suspend-read mode. Fast Mode Set/Reset Command Fast Mode function dispenses with the initial two unlock cycles required in the standard program command sequence writing Fast Mode command into the command register. In this mode the required bus cycle for programming is two cycles instead of four bus cycles in standard program command. The read operation is also executed after exiting this mode. During the Fast mode, do not write any commands other than the Fast program/ Fast mode reset command. To exit this mode, write Fast Mode Reset command into the command register. Refer to "Embedded Program Algorithm for Fast Mode". The VCC active current is required even CE = VIH during Fast Mode.
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Fast Programming During Fast Mode, the programming can be executed with two bus cycles operation. The Embedded Program Algorithm is executed by writing program set-up command (A0h) and data write cycles (PA/PD). Refer to "Embedded Program Algorithm for Fast Mode". Extended Sector Group Protection In addition to normal sector group protection, the device has Extended Sector Group Protection as extended function. This function enables protection of the sector group by forcing VID on RESET pin and writes a command sequence. Unlike conventional procedures, it is not necessary to force VID and control timing for control pins. The only RESET pin requires VID for sector group protection in this mode. The extended sector group protection requires VID on RESET pin. With this condition, the operation is initiated by writing the set-up command (60h) into the command register. Then the sector group addresses pins (A21, A20, A19, A18, and A17) and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) should be set to the sector group to be protected (set VIL for the other addresses pins is recommended), and write extended sector group protection command (60h). A sector group is typically protected in 250 s. To verify programming of the protection circuitry, the sector group addresses pins (A20, A19, A18, A17, A16, A15, A14, A13 and A12) and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) should be set and write a command (40h). Following the command write, a logical "1" at device output DQ0 will produce for protected sector in the read operation. If the output data is logical "0", write the extended sector group protection command (60h) again. To terminate the operation, set RESET pin to VIH. (Refer to the "Extended Sector Group Protection Timing Diagram" in s SWITCHING WAVEFORMS and "Extended Sector Group Protection Algorithm" in s FLOW CHART.) Query Command (CFI : Common Flash Memory Interface) To verify programming of the protection circuitry, the sector group addresses pins (A20, A19, A18, A17, A16, A15, A14, A13 and A12) and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) should be set and write a command (40h). Following the command write, a logical "1" at device output DQ0 will produce for protected sector in the read operation. If the output data is logical "0", write the extended sector group protection command (60h) again. To terminate the operation, set RESET pin to VIH. (Refer to the "Extended Sector Group Protection Timing Diagram" in s SWITCHING WAVEFORMS and "Extended Sector Group Protection Algorithm" in s FLOW CHART.) The operation is initiated by writing the query command (98h) into the command register. Following the command write, a read cycle from specific address retrives device information. Refer to "Common Flash Memory Interface Code" in s DEVICE BUS OPERATION in detail. Please note that output data of upper byte (DQ15 to DQ8) is "0" in word mode (16 bit) read. To terminate operation, write the Read/Reset command sequence into the register. HiddenROM Mode HiddenROM Region The HiddenROM (HiddenROM) feature provides a Flash memory region that the system may access through a new command sequence. This is primarily intended for customers who wish to use an Electronic Serial Number (ESN) in the device with the ESN protected against modification. Once the HiddenROM region is protected, any further modification of that region is impossible. This ensures the security of the ESN once the product is shipped to the field. This device occupies the address of the 000000h to 00007Fh. After the system writes the HiddenROM Entry command sequence, it may read the HiddenROM region by using device addresses A6 to A0 (A20 to A7 are all "0"). That is, the device sends only program command that would normally be sent to the address to the HiddenROM region. This mode of operation continues until the system issues the Exit HiddenROM command sequence, or until power is removed from the device. On power-up, or following a hardware reset, the device reverts to sending commands to the address. If you request Fujitsu to program the ESN in the device, please contact a Fujitsu representative for more information.
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HiddenROM Entry Command The device has a HiddenROM area with One Time Protect function. This area is to enter the security code and to unable the change of the code once set. Program/erase is possible in this area until it is protected. However once it is protected, it is impossible to unprotect. Therefore extreme caution is required. HiddenROM area is 128 words. This area is normally the "outermost" 8K words boot block area. Therefore, write the HiddenROM entry command sequence to enter the HiddenROM area. It is called HiddenROM mode when the HiddenROM area appears. Sectors other than the block area SA0 can be read during HiddenROM mode. Read/program of the HiddenROM area is possible during HiddenROM mode. Write the HiddenROM reset command sequence to exit the HiddenROM mode. Note that any other commands should not be issued than the HiddenROM program/protection/reset commands during the HiddenROM mode. When you issue the other commands including the suspend resume capability, send the HiddenROM reset command first to exit the HiddenROM mode and then issue each command. HiddenROM Program Command To program the data to the HiddenROM area, write the HiddenROM program command sequence during HiddenROM mode. This command is the same as the program command in usual except to write the command during HiddenROM mode. Therefore the detection of completion method is the same as using the DQ7 data polling, and DQ6 toggle bit. Need to pay attention to the address to be programmed. If the address other than the HiddenROM area is selected to program, data of the address are changed.During the write into the HiddenROM region, the program suspend command issuance is prohibited. HiddenROM Protect Command The method to protect the HiddenROM is to apply high voltage (VID) to A9 and OE, set the sector address in the HiddenROM area and (A6, A3, A2, A1, A0) = (0, 0, 0, 1, 0) , and apply the write pulse during the HiddenROM mode. The same command sequence may be used because it is the same as the extension sector group protect in the past, except that it is in the HiddenROM mode and does not apply high voltage to the RESET pin. Please refer to above mentioned "Extended Sector Group Protection" for details of sector group protect setting. The same command sequence may be used because it is the same as the extension sector group protect in the past, except that it is in the HiddenROM mode and does not apply high voltage to the RESET pin. Please refer to above mentioned "Extended Sector Group Protection" for details of sector group protect setting. Other sector will be effected if the address other than those for HiddenROM area is selected for the sector address, so please be carefull. Once it is protected, protection can not be cancelled, so please pay the closest attention. Write Operation Status Hardware Sequence Flags Detailed in "Hardware Sequence Flags" are all the status flags which can determine the status of the bank for the current mode operation. During sector erase, the part provides the status flags automatically to the I/O ports. The information on DQ2 is address-sensitive. This means that if an address from an erasing sector is consecutively read, the DQ2 bit will toggle. However, DQ2 will not toggle if an address from a non-erasing sector is consecutively read. This allows users to determine which sectors are in erase and which are not.
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Hardware Sequence Flags Table DQ6 DQ7 DQ7 0 Data Data 1 Data DQ7 DQ7 0 DQ7 DQ7 DQ7 N/A Toggle Toggle Data Data 1 Data Toggle Toggle Toggle Toggle Toggle Toggle Toggle
Status Embedded Erase Algorithm Program Suspend Mode
DQ5 0 0 Data Data 0 Data 0 1 1 1 0 1 0
DQ3 0 1 Data Data 0 Data 0 0 1 0 N/A N/A N/A
DQ2 1 Toggle *1 Data Data Toggle *1 Data 1 *2 1 N/A N/A N/A N/A N/A
DQ1 *3 0 N/A Data Data N/A Data N/A N/A N/A N/A 0 0 1
Embedded Program Algorithm Program-Suspend-Read (Program Suspend Sector) Program-Supend -Read (Non-Program Suspended Sector) Erase Suspend Read (Erase Suspended Sector) Erase Suspend Read (Non-Erase Suspended Sector) Erase Suspend Program (Non-Erase Suspended Sector)
In Progress
Erase Suspend Mode
Embedded Program Algorithm Exceeded Embedded Erase Algorithm Time Erase Erase Suspend Program Limits Suspend (Non-Erase Suspended Sector) Mode Write to Buffer *4 BUSY State Exceeded Timing Limits ABORT State
*1 : Successive reads from the erasing or erase-suspend sector will cause DQ2 to toggle. *2 : Reading from non-erase suspend sector address will indicate logic "1" at the DQ2 bit. *3 : DQ1 indicates the Write-to-Buffer ABORT status during Write-Buffer-Programming operations. *4 : The Data Polling algorithm detailed in "Data Polling Algorithm" in " s FLOW CHART" should be used for WriteBuffer-Programming operations. Note that DQ7 during Write-Buffer-Programming indicates the data-bar for DQ7 data for the LAST LOADED WRITE-BUFFER ADDRESS location. DQ7 Data Polling The device features Data Polling as a method to indicate to the host that the Embedded Algorithms are in progress or completed. During the Embedded Program Algorithm, an attempt to read the device will produce a complement of data last written to DQ7. Upon completion of the Embedded Program Algorithm, an attempt to read the device will produce true data last written to DQ7. During the Embedded Erase Algorithm, an attempt to read the device will produce a "0" at the DQ7 output. Upon completion of the Embedded Erase Algorithm, an attempt to read device will produce a "1" on DQ7. The flowchart for Data Polling (DQ7) is shown in "Data Polling Algorithm". For programming, the Data Polling is valid after the rising edge of the fourth write pulse in the four write pulse sequences. For programming, the Data Polling is valid after the rising edge of the fourth write pulse in the four write pulse sequences. For chip erase and sector erase, the Data Polling is valid after the rising edge of the sixth write pulse in the six write pulse sequences. Data Polling must be performed at sector addresses of sectors being erased, not protected sectors. Otherwise the status may become invalid. If a program address falls within a protected sector, Data Polling on DQ7 is active for approximately 1 s, then that bank returns to the read mode. After an erase command sequence is written, if all sectors selected for erasing are protected, Data Polling on DQ7 is active for approximately 400 s, then the bank returns to read mode. 24
MBM29PL65LM-90/10
Once the Embedded Algorithm operation is close to being completed, the device data pins (DQ7) may change asynchronously while the output enable (OE) is asserted low. This means that device is driving status information on DQ7 at one instant, and then that byte's valid data at the next instant. Depending on when the system samples the DQ7 output, it may read the status or valid data. Even if device has completed the Embedded Algorithm operation and DQ7 has a valid data, data outputs on DQ0 to DQ6 may still be invalid. The valid data on DQ0 to DQ7 will be read on successive read attempts. The Data Polling feature is active only during the Embedded Programming Algorithm, Embedded Erase Algorithm or sector erase time-out. See "Toggle Bit Status" and "Data Polling during Embedded Algorithm Operation Timing Diagram". DQ6 Toggle Bit I The device also features the "Toggle Bit I" as a method to indicate to the host system that the Embedded Algorithms are in progress or completed. During Embedded Program or Erase Algorithm cycle, successive attempts to read (OE toggling) data from the busy bank will result in DQ6 toggling between one and zero. Once the Embedded Program or Erase Algorithm cycle is completed, DQ6 will stop toggling and valid data will be read on the next successive attempts. During programming, the Toggle Bit I is valid after the rising edge of the fourth write pulse in the four write pulse sequences. For chip erase and sector erase, the Toggle Bit I is valid after the rising edge of the sixth write pulse in the six write pulse sequences. The Toggle Bit I is active during the sector time out. In programming, if the sector being written is protected, the toggle bit will toggle for about 1 s and then stop toggling with data unchanged. In erase, the device will erase all selected sectors except for protected ones. If all selected sectors are protected, the chip will toggle the toggle bit for about 400 s and then drop back into read mode, having data kept remained. Either CE or OE toggling will cause DQ6 to toggle. In addition, an Erase Suspend/Resume command will cause DQ6 to toggle. The system can use DQ6 to determine whether a sector is actively erased or is erase-suspended. When a bank is actively erased (that is, the Embedded Erase Algorithm is in progress) , DQ6 toggles. When a bank enters the Erase Suspend mode, DQ6 stops toggling. Successive read cycles during erase-suspend-program cause DQ6 to toggle. See "AC Wavefrom for Toggle Bit I during Embedded Algorithm Operations". DQ5 Exceeded Timing Limits DQ5 will indicate if the program or erase time has exceeded the specified limits (internal pulse count) . Under these conditions DQ5 will produce "1". This is a failure condition indicating that the program or erase cycle was not successfully completed. Data Polling is only operating function of the device under this condition. The CE circuit will partially power down device under these conditions (to approximately 2 mA) . The OE and WE pins will control the output disable functions as described in "MBM29PL65LM User Bus Operations Table (DW/W = VIL)" and "MBM29XL12DF User Bus Operations Table (DW/W = VIH)" in s DEVICE BUS OPERATION. The DQ5 failure condition may also appear if a user tries to program a non-blank location without pre-erase. In this case the device locks out and never completes the Embedded Algorithm operation. Hence, the system never reads valid data on DQ7 bit and DQ6 never stop toggling. Once the device has exceeded timing limits, the DQ5 bit will indicate a "1." Please note that this is not a device failure condition since the device was incorrectly used. If this occurs, reset device with the command sequence. DQ3 Sector Erase Timer After completion of the initial sector erase command sequence, sector erase time-out begins. DQ3 will remain low until the time-out is completed. Data Polling and Toggle Bit are valid after the initial sector erase command sequence. 25
MBM29PL65LM-90/10
If Data Polling or the Toggle Bit I indicates that a valid erase command has been written, DQ3 may be used to determine whether the sector erase timer window is still open. If DQ3 is high ("1") the internally controlled erase cycle has begun. If DQ3 is low ("0") , the device will accept additional sector erase commands. To insure the command has been accepted, the system software should check the status of DQ3 prior to and following each subsequent Sector Erase command. If DQ3 were high on the second status check, the command may not have been accepted. See "Hardware Sequence Flags". DQ2 Toggle Bit II This toggle bit II, along with DQ6, can be used to determine whether the device is in the Embedded Erase Algorithm or in Erase Suspend. Successive reads from the erasing sector will cause DQ2 to toggle during the Embedded Erase Algorithm. If the device is in the erase-suspended-read mode, successive reads from the erase-suspended sector will cause DQ2 to toggle. When the device is in the erase-suspended-program mode, successive reads from the non-erase suspended sector will indicate a logic "1" at the DQ2 bit. DQ6 is different from DQ2 in that DQ6 toggles only when the standard program or Erase, or Erase Suspend Program operation is in progress. The behavior of these two status bits, along with that of DQ7, is summarized as follows : For example, DQ2 and DQ6 can be used together to determine if the erase-suspend-read mode is in progress. (DQ2 toggles while DQ6 does not.) See also "Toggle Bit Status" and "DQ2 vs DQ6". Furthermore DQ2 can also be used to determine which sector is being erased. At the erase mode, DQ2 toggles if this bit is read from an erasing sector. Reading Toggle Bits DQ6/DQ2 Whenever the system initially begins reading toggle bit status, it must read DQ7 to DQ0 at least twice in a row to determine whether a toggle bit is toggling. Typically a system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ7 to DQ0 on the following read cycle. However, if, after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5) . If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation. Refer to "Toggle Bit Algorithm".
26
MBM29PL65LM-90/10
Toggle Bit Status Table DQ7 DQ7 0 1 DQ7
Mode Program Erase Erase-Suspend-Read (Erase-Suspended Sector) Erase-Suspend-Program
DQ6 Toggle Toggle 1 Toggle
DQ2 1 Toggle *1 Toggle *1 1 *2
*1 : Successive reads from the erasing or erase-suspend sector will cause DQ2 to toggle. *2 : Reading from non-erase suspend sector address will indicate logic "1" at the DQ2 bit. DQ1 Write-to-Buffer Abort DQ1 indicates whether a Write-to-Buffer operation was aborted. Under these conditions DQ1 produces a "1". The system must issue the Write-to-Buffer-Abort-Reset command sequence to return the device to reading array data. See "Write Buffer Programming Operations" section for more details. Data Protection The device is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transitions. During power up device automatically resets internal state machine to Read mode. Also, with its control register architecture, alteration of memory contents only occurs after successful completion of specific multi-bus cycle command sequence. Device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up and power-down transitions or system noise. Low VCC Write Inhibit To avoid initiation of a write cycle during VCC power-up and power-down, a write cycle is locked out for VCC less than VLKO. If VCC < VLKO, the command register is disabled and all internal program/erase circuits are disabled. Under this condition, the device will reset to the read mode. Subsequent writes will be ignored until the VCC level is greater than VLKO. It is the user's responsibility to ensure that the control pins are logically correct to prevent unintentional writes when VCC is above VLKO. If Embedded Erase Algorithm is interrupted, the intervened erasing sector(s) is(are) not valid. Write Pulse "Glitch" Protection Noise pulses of less than 3 ns (typical) on OE, CE, or WE will not initiate a write cycle. Logical Inhibit Writing is inhibited by holding any one of OE = VIL, CE = VIH, or WE = VIH. To initiate a write cycle, CE and WE must be a logical zero while OE is a logical one. Power-up Write Inhibit Power-up of the device with WE = CE = VIL and OE = VIH will not accept commands on the rising edge of WE. The internal state machine is automatically reset to read mode on power-up. Sector Protection Device user is able to protect each sector group individually to store and protect data. Protection circuit voids both write and erase commands that are addressed to protected sectors. Any commands to write or erase addressed to protected sector are ignored. 27
MBM29PL65LM-90/10
s ABSOLUTE MAXIMUM RATINGS
Parameter Storage Temperature Ambient Temperature with Power Applied Voltage with Respect to Ground All Pins Except A9, OE, and RESET *1,*2 Power Supply Voltage *1 A9, OE, and RESET * * WP/ACC *1,*3 *1 : Voltage is defined on the basis of VSS = GND = 0 V. *2 : Minimum DC voltage on input or I/O pins is -0.5 V. During voltage transitions, input or I/O pins may undershoot VSS to -0.2 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods of up to 20 ns *3 : Minimum DC input voltage is -0.5V. During voltage transitions, these pins may undershoot VSS to -0.2 V for periods of up to 20 ns.Voltage difference between input and supply voltage ( VIN-VCC) dose not exceed to +9.0 V.Maximum DC input voltage is +12.5 V which may overshoot to +14.0 V for periods of up to 20 ns . WARNING: Semiconductor devices can be permanently damaged by application of stress (voltage, current, temperature, etc.) in excess of absolute maximum ratings. Do not exceed these ratings.
1, 3
Symbol Tstg TA VIN, VOUT VCC,VCCQ VIN VACC
Rating Min -55 -20 -0.5 -0.5 -0.5 -0.5 Max +125 +85 VCC +0.5 +4.0 +12.5 +12.5
Unit C C V V V V
s RECOMMENDED OPERATING RANGES*1
Parameter Ambient Temperature VCC Supply Voltage *2, *3 VCCQ Supply Voltage * *
2, 3
Symbol 90 10 TA VCC VCCQ
Value Min -20 -20 +3.0 VCC Max +70 +85 +3.6
Unit C V V
*1 : Operating ranges define those limits between which the functionality of the device is guaranteed. *2 : Voltage is defined on the basis of VSS = GND = 0 V. *3 : VCC and VCCQ supply voltage must be on the same level. WARNING: The recommended operating conditions are required in order to ensure the normal operation of the semiconductor device. All of the device's electrical characteristics are warranted when the device is operated within these ranges. Always use semiconductor devices within their recommended operating condition ranges. Operation outside these ranges may adversely affect reliability and could result in device failure. No warranty is made with respect to uses, operating conditions, or combinations not represented on the data sheet. Users considering application outside the listed conditions are advised to contact their FUJITSU representatives beforehand. 28
MBM29PL65LM-90/10
s MAXIMUM OVERSHOOT/MAXIMUM UNDERSHOOT
1. Maximum Undershoot Waveform
+0.6 V -0.5 V -2.0 V
20 ns
20 ns
20 ns
2. Maximum Overshoot Waveform 1
20 ns
VCC +2.0 V VCC +0.5 V 0.7 x VCC
20 ns 20 ns
3. Maximum Overshoot Waveform 2
20 ns
+14.0 V +12.5 V VCC +0.5 V
20 ns 20 ns
Note : This waveform is applied for A9, OE and RESET.
29
MBM29PL65LM-90/10
s ELECTRICAL CHARACTERISTICS
1. DC Characteristics
Parameter Input Leakage Current Output Leakage Current A9, OE, RESET Inputs Leakage Current VCC Active Current (Read ) *1,*2 VCC Active Current (Intra-Page Read ) *2 VCC Active Current (Program / Erase) *2,*3 VCC Standby Current *2 Symbol ILI ILO ILIT ICC1 ICC2 ICC3 Conditions VIN = VSS to VCC, VCC = VCC Max WP Pin Others Value Min -2.0 -1.0 -1.0 -- -- -- -- -- Typ -- -- -- -- 15 35 10 50 Max +2.0 +1.0 +1.0 35 25 50 20 60 Unit A A A mA mA mA mA
VOUT = VSS to VCC, VCC = VCC Max VCC = VCC Max, A9, OE, RESET = 12.5 V CE = VIL, OE = VIH, f = 5 MHz CE = VIL, OE = VIH, f = 10 MHz CE = VIL, OE = VIH, tPRC = 25 ns, 4-Word CE = VIL, OE = VIH CE = VCC 0.3 V, RESET = VCC 0.3 V, OE = VIH, WP = VCC 0.3 V RESET = VCC 0.3 V, WP = VCC 0.3 V CE = VSS 0.3 V, RESET = VCC 0.3 V, VIN = VCC 0.3 V or Vss 0.3 V, WP = VCC 0.3 V CE = VIL, OE = VIH CE = VIL, OE = VIH, Vcc = Vcc Max, ACC =VACC Max -- -- ACC Pin Vcc Pin
ICC4
--
1
5
A
VCC Reset Current *2 VCC Automatic Sleep Current *4 VCC Active Current (Erase-Suspend-Program) *2 ACC Accelerated Program Current Input Low Level Input High Level Voltage for ACC Sector Protection/Unprotection and Program Acceleration Voltage for Autoselect, and Temporary Sector Unprotected Output Low Voltage Level Output High Voltage Level Low VCC Lock-Out Voltage
ICC5
--
1
5
A
ICC6
--
1
5
A
ICC7
-- -- -- -0.5 0.7 x VCC 11.5
50 -- -- -- -- 12.0
60 45 60 0.6 VCC + 0.3 12.5
mA
IACC VIL VIH
mA V V V
VACC VCC = 3.0 V to 3.6 V
VID VOL VOH VLKO
VCC = 3.0 V to 3.6 V IOL = 4.0 mA, VCC = VCC Min, VCCQ = VCCQ Min IOH = -2.0 mA, VCC = VCC Min, VCCQ = VCCQ Min --
11.5 -- 0.85 x VCCQ 2.3
12.0 -- -- --
12.5 0.45 -- 2.5
V V V V
*1 : The lCC current listed includes both the DC operating current and the frequency dependent component. *2 : Maximum ICC values are tested with VCC = VCC Max and VCCQ = VCCQ Max. *3 : ICC active while Embedded Erase or Embedded Program or Write Buffer Programming is in progress. *4 : Automatic sleep mode enables the low power mode when address remain stable for tACC + 30 ns. 30
MBM29PL65LM-90/10
2. AC Characteristics
* Read Only Operations Characteristics Parameter Read Cycle Time Address to Output Delay Chip Enable to Output Delay Page Read Cycle Time Page Address to Output Delay Output Enable to Output Delay Chip Enable to Output High-Z Output Enable Hold Time Read Toggle and Data Polling tOEH tDF tOH tREADY tOEH tDF tOH tREADY Symbol
JEDEC Standard
Condition -- CE = VIL, OE = VIL OE = VIL -- CE = VIL, OE = VIL -- -- -- -- -- -- --
MBM29PL65LM-90*
MBM29PL65LM-10*
Min 90 -- -- 25 -- -- -- 0 10 -- 0 --
Typ -- -- -- -- -- -- -- -- -- -- -- --
Max -- 90 90 -- 25 25 25 -- -- 25 -- 20
Min 100 -- -- 30 -- -- -- 0 10 -- 0 --
Typ -- -- -- -- -- -- -- -- -- -- -- --
Max -- 100 100 -- 30 30 30 -- -- 30 -- 20
Unit ns ns ns ns ns ns ns ns ns ns ns s
tRC tACC tCE tPRC tPACC tOE tDF
tRC tACC tCE tPRC tPACC tOE tDF
Output Enable to Output High-Z Output Hold Time From Addresses, CE or OE, Whichever Occurs First RESET Pin Low to Read Mode
* : Test Conditions; Input pulse levels : 0.0 V / VCC Input rise times : 5 ns Input fall times : 5 ns Timing measurement reference level Input : 0.5 x VCC Output : 0.5 x VCC Output Load : 1 TTL + 30 pF
*Test Conditions
3.3 V Diode = 1N3064 or Equivalent Device Under Test 6.2 k CL Diode = 1N3064 or Equivalent
2.7 k
31
MBM29PL65LM-90/10
* Write (Erase/Program) Operations Symbol Parameter
JEDEC Standard
MBM29PL65LM-90 MBM29PL65LM-10 Unit Min 90 0 15 45 0 35 0 0 20 20 0 0 0 0 0 0 35 35 25 30 -- Typ -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 23.5 100 1.0 -- Max -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- Min 100 0 15 45 0 35 0 0 20 20 0 0 0 0 0 0 35 35 25 30 -- -- -- 50 Typ -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 23.5 100 1.0 -- Max -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns s s s s
Write Cycle Time Address Setup Time Address Setup Time to OE Low During Toggle Bit Polling Address Hold Time Address Hold Time from CE or OE High During Toggle Bit Polling Data Setup Time Data Hold Time Output Enable Setup Time CE High During Toggle Bit Polling OE High During Toggle Bit Polling Read Recover Time Before Write (OE High to WE Low) Read Recover Time Before Write (OE High to CE Low) CE Setup Time WE Setup Time CE Hold Time WE Hold Time CE Pulse Width Write Pulse Width CE Pulse Width High Write Pulse Width High
tWC tAS tASO tAH tAHT tDS tDH tOES tCEPH tOEPH tGHWL tGHEL tCS tWS tCH tWH tCP tWP tCPH tWPH
tWC tAS tASO tAH tAHT tDS tDH tOES tCEPH tOEPH tGHWL tGHEL tCS tWS tCH tWH tCP tWP tCPH tWPH
Effective Page Programming Time Per Word (Write Buffer Programming) tWHWH1 Programming Time Sector Erase Operation *1 VCC Setup Time Word tWHWH2 tVCS
tWHWH1 -- tWHWH2 tVCS -- 50
(Continued)
32
MBM29PL65LM-90/10
(Continued)
Parameter Rise Time to VID *2 Rise Time to VACC *
3 2
Symbol
JEDEC Standard
MBM29PL65LM-90 Min 500 500 4 100 4 4 500 100 -- 50 -- Typ -- -- -- -- -- -- -- -- -- -- -- Max -- -- -- -- -- -- -- -- 90 -- 20
MBM29PL65LM-10 Min 500 500 4 100 4 4 500 100 -- 50 -- Typ -- -- -- -- -- -- -- -- -- -- -- Max -- -- -- -- -- -- -- -- 100 -- 20
Unit ns ns s s s s ns ns ns s s
tVIDR tVACCR tVLHT tWPP
2
tVIDR tVACCR tVLHT tWPP tOESP tCSP tRP tRH tEOE tTOW tSPD
Voltage Transition Time * Write Pulse Width *
2
OE Setup Time to WE Active * CE Setup Time to WE Active * RESET Pulse Width
tOESP tCSP tRP tRH tEOE tTOW tSPD
2
RESET High Time Before Read Delay Time from Embedded Output Enable Erase Time-out Time Erase Suspend Transition Time
*1 : This does not include the preprogramming time. *2 : This timing is for Sector Group Protection operation. *3 : This timing is for Accelerated Program operation.
s ERASE AND PROGRAMMING PERFORMANCE
Parameter Sector Erase Time Programming Time Effective Page Programming Time (Write Buffer Programming) Chip Programming Time Absolute Maximum Programming Time (16 words) Erase/Program Cycle Limits Min -- -- -- -- -- 100,000 Typ 1 100 23.5 -- -- -- Max 15 3000 -- 600 6 -- Unit s s s s ms cycle Non programming within the same page -- Excludes system-level overhead Remarks Excludes programming time prior to erasure
s TSOP (1) PIN CAPACITANCE
Parameter Input Capacitance Output Capacitance Control Pin Capacitance RESET pin and ACC Pin Capacitance Symbol CIN COUT CIN2 CIN3 Test Setup VIN = 0 VOUT = 0 VIN = 0 VIN = 0 Value Min -- -- -- -- Typ 8 8.5 8 20 Max 10 12 10 25 Unit pF pF pF pF
Note : Test conditions TA = +25C, f = 1.0 MHz DQ15 pin capacitance is stipulated by output capacitance. 33
MBM29PL65LM-90/10
s TIMING DIAGRAM
* Key to Switching Waveforms
WAVEFORM INPUTS Must Be Steady May Change from H to L May Change from L to H "H" or "L" Any Change Permitted Does Not Apply OUTPUTS Will Be Steady Will Be Changing from H to L Will Be Changing from L to H Changing State Unknown Center Line is HighImpedance "Off" State
(1) Read Operation Timing Diagram
tRC
Address
Address Stable
tACC
CE
tOE tDF
OE
tOEH
WE
tCE tOH
Data
High-Z
Output Valid
High-Z
34
MBM29PL65LM-90/10
(2) Page Read Operation Timing Diagram
A21 to A2 A1, A0
Address Valid
Aa tRC tACC
Ab tPRC
Ac
CE
tCE
OE
tOEH
tOE tDF
WE Data High-Z
tPACC tOH Da
tPACC tOH Db tOH Dc
(3) Hardware Reset Timing Diagram
tRC
Address
tACC
Address Stable
CE
tRH
tRP
tRH
tCE
RESET
tOH
Data
High-Z
Output Valid
35
MBM29PL65LM-90/10
(4) Alternate WE Controlled Program Operation Timing Diagram
3rd Bus Cycle Address
555h tWC tAS PA tAH
Data Polling
PA tRC
CE
tCS tCH tCE
OE
tGHWL tWP tWPH tWHWH1 tOE
WE
tDS tDH tDF tOH
Data
A0h
PD
DQ7
DOUT
DOUT
PA PD DQ7 DOUT
: Address of the memory location to be programmed. : Data to be programmed at word address. : The output of the complement of the data written to the device. : The output of the data written to the device
Note : Figure indicates the last two bus cycles out of four bus cycle sequence.
36
MBM29PL65LM-90/10
(5) Alternate CE Controlled Program Operation Timing Diagram
3rd Bus Cycle Data Polling PA tAS tAH PA
Address
555h tWC
WE
tWS tWH
OE
tGHEL tCP tCPH tWHWH1
CE
tDS tDH
Data
A0h
PD
DQ 7
D OUT
PA PD DQ7 DOUT
: Address of the memory location to be programmed. : Data to be programmed at word address. : The output of the complement of the data written to the device. : The output of the data written to the device.
Note : Figure indicates the last two bus cycles out of four bus cycle sequence.
37
MBM29PL65LM-90/10
(6) Chip/Sector Erase Operation Timing Diagram
Address
555h tWC
2AAh tAS tAH
555h
555h
2AAh
SA*
SA*
CE
tCS tCH
OE
tGHWL tWP tWPH tTOW
WE
tDS AAh tDH 55h 80h AAh 55h
10h for Chip Erase 10h/ 30h tBUSY 30h
Data
RY/BY
tVCS
VCC
* : SA is the sector address for Sector Erase. Address = 555h (Word), AAAh (Byte) for Chip Erase.
38
MBM29PL65LM-90/10
(7) Erase Suspend Operation Timing Diagram
Address
XXXh tWC
CE
tCS tWP tCH
WE
tDS B0h tSPD
Data RY/BY
(8) Data Polling during Embedded Algorithm Operation Timing Diagram
Address
VA
CE
tCH
tOE
tDF
OE
tOEH
WE
4 ms tCE
*
DQ7
Data DQ7 DQ7 = Valid Data High-Z
tWHWH1 or 2
DQ6 to DQ0
Data
DQ6 to DQ0 = Output Flag tEOE
DQ6 to DQ0 Valid Data
High-Z
* : DQ7 = Valid Data (The device has completed the Embedded operation.)
Note : When checking Hardware Sequence Flags during program operations, it should be checked 4 s after issuing program command. 39
MBM29PL65LM-90/10
(9) Toggle Bit l Timing Diagram during Embedded Algorithm Operations
Address
tAHT tASO tAHT tAS
CE
tCEPH
WE
4 ms
tOEPH tOEH
OE
tDH tOE tCE
DQ 6/DQ2
Data
Toggle Data
Toggle Data
Toggle Data
*
Stop
Toggling
Output Valid
* : DQ6 stops toggling (The device has completed the Embedded operation). Note : When checking Hardware Sequence Flags during program operations, it should be checked 4 s after issuing program command.
(10) DQ2 vs. DQ6
E nter E m bedded E rasing WE
E rase S uspend E rase
E nter E rase S uspend P rogram E rase S uspend P rogram
E rase R esum e E rase S uspend R ead E rase E rase C om plete
E rase S uspend R ead
DQ6
DQ2* T oggle D Q 2 and D Q 6 w ith O E or C E
* : DQ2 is read from the erase-suspended sector.
40
MBM29PL65LM-90/10
(11) RESET Timing Diagram ( Not during Embedded Algorithms )
CE, OE
tRH
RESET
tRP tREADY
(12) RESET Timing Diagram ( During Embedded Algorithms )
tREADY
CE, OE
RESET
tRP
41
MBM29PL65LM-90/10
(13) Sector Group Protection Timing Diagram
A21, A20, A19 A18, A17
SGAX
SGAY
A6, A3, A2, A0
A1
VID VIH A9
tVLHT
VID VIH OE
tVLHT tWPP tVLHT tVLHT
WE
tOESP
CE
tCSP
Data
tVCS tOE
01h
VCC
SGAX : Sector Group Address to be protected SGAY : Next Sector Group Address to be protected
42
MBM29PL65LM-90/10
(14) Temporary Sector Group Unprotection Timing Diagram
VCC
tvCS tVIDR
tVLHT
VID VSS, VIL or VIH RESET
CE
WE
tVLHT
Program or Erase Command Sequence
tVLHT
Unprotection period
43
MBM29PL65LM-90/10
(15) Extended Sector Group Protection Timing Diagram
V CC
tVCS
RESET tVLHT tVIDR A ddress SGAX SGAX SGAY
A 6, A 3, A 2, A 0
A1
CE
OE T IM E -O U T
WE
D ata
60h
60h
40h tOE
01h
60h
: Sector Group Address to be protected : Next Sector Group Address to be protected TIME-OUT : Time-Out window = 250 ms (Min)
SGAX SGAY
44
MBM29PL65LM-90/10
(16) Accelerated Program Timing Diagram
VCC tVCS VACC ACC
tVACCR tVLHT
CE
WE tVLHT Program Command Sequence tVLHT
Acceleration period
45
MBM29PL65LM-90/10
s FLOW CHART
(1) Embedded ProgramTM Algorithm EMBEDDED ALGORITHMS
Start
Write Program Command Sequence (See Below)
Data Polling Embedded Program Algorithm in progress
No
Verify Data ? Yes
Increment Address
No
Last Address ? Yes
Programming Completed
Program Command Sequence (Address/Command): 555h/AAh
2AAh/55h
555h/A0h
Program Address/Program Data
46
MBM29PL65LM-90/10
(2) Embedded EraseTM Algorithm EMBEDDED ALGORITHMS
Start
Write Erase Command Sequence (See Below)
Data Polling Embedded Erase Algorithm in progress
No
Data = FFh ? Yes Erasure Completed
Chip Erase Command Sequence (Address/Command): 555h/AAh
Individual Sector/Multiple Sector Erase Command Sequence (Address/Command): 555h/AAh
2AAh/55h
2AAh/55h
555h/80h
555h/80h
555h/AAh
555h/AAh
2AAh/55h
2AAh/55h Sector Address /30h Sector Address /30h Sector Address /30h
555h/10h
Additional sector erase commands are optional.
47
MBM29PL65LM-90/10
(3) Data Polling Algorithm
Start Wait 4 ms after issuing Program command Read Byte (DQ 7 to DQ 0) Addr. = VA
DQ 7 = Data? No No DQ 5 = 1? Yes Read Byte (DQ 7 to DQ 0) Addr. = VA
Yes
DQ 7 = Data? * No Fail
Yes
Pass
VA
= Valid address for programming = Any of the sector addresses within the sector being erased during sector erase or multiple sector erases operation = Any of the sector addresses within the sector not being protected during chip erase operation (There may not be accurate indications to determine that the data polling has been completed.)
* : DQ7 is rechecked even if DQ5 = "1" because DQ7 may change simultaneously with DQ5.
48
MBM29PL65LM-90/10
(4) Toggle Bit Algorithm
Start Wait 4 s after issuing Program command Read DQ7 to DQ0 Addr. = "H" or "L" *1 Read DQ7 to DQ0 Addr. = "H" or "L"
DQ6 = Toggle? Yes No DQ5 = 1? Yes
No
*1, *2 Read DQ7 to DQ0 Addr. = "H" or "L" *1, *2 Read DQ7 to DQ0 Addr. = "H" or "L"
DQ6 = Toggle? Yes Program/Erase Operation Not Complete.Write Reset Command
No
Program/Erase Operation Complete
*1 : Read Toggle bit twice to determine whether it is toggling. *2 : Recheck Toggle bit because it may stop toggling as DQ5 changes to "1".
49
MBM29PL65LM-90/10
(5) Sector Group Protection Algorithm
Start
Setup Sector Group Addr. (A21, A20, A19, A18, A17)
PLSCNT = 1 OE = VID, A9 = VID CE = VIL, RESET = VIH A6 = A3 = A2 = A0 = VIL, A1 = VIH
Activate WE Pulse Increment PLSCNT Time out 100 s
WE = VIH, CE = OE = VIL (A9 should remain VID) Read from Sector Group Addr. = SGA, A1 = VIH A6 = A3 = A2 = A0 = VIL Data = 01h? Yes Protect Another Sector Group? No Device Failed Remove VID from A9 Write Reset Command Yes
(
No PLSCNT = 25? Yes Remove VID from A9 Write Reset Command No
)
Sector Group Protection Completed
50
MBM29PL65LM-90/10
(6) Temporary Sector Group Unprotection Algorithm
Start
RESET = VID *1
Perform Erase or Program Operations
RESET = VIH
Temporary Sector Group Unprotection Completed *2
*1 : All protected sector groups are unprotected. *2 : All previously protected sector groups are protected.
51
MBM29PL65LM-90/10
(7) Extended Sector Group Protection Algorithm
Start
RESET = VID
Wait to 4 s
Device is Operating in Temporary Sector Group Unprotection Mode
No
Extended Sector Group Protection Entry? Yes To Setup Sector Group Protection Write XXXh/60h
PLSCNT = 1
To Protect Sector Group Write 60h to Sector Address
(A6 = A3 = A2 = A0 =VIL, A1 = VIH)
Increment PLSCNT
Time Out 250 s Setup Next Sector Group Address
To Verify Sector Group Protection Write 40h to Sector Address (A6 = A3 = A2 = A0 =VIL, A1 = VIH)
Read from Sector Group Address (A6 = A3 = A2 = A0 =VIL, A1 = VIH) No No PLSCNT = 25? Yes Remove VID from RESET Write Reset Command Data = 01h? Yes Yes Protection Other Sector Group ? No Device Failed Remove VID from RESET Write Reset Command
Sector Group Protection Completed
52
MBM29PL65LM-90/10
(8) Embedded ProgramTM Algorithm for Fast Mode FAST MODE ALGORITHM
Start
555h/AAh
2AAh/55h
Set Fast Mode
555h/20h
XXXh/A0h
Program Address/Program Data
Data Polling
Verify Data? Yes No
No
In Fast Program
Increment Address
Last Address ? Yes Programming Completed
XXXh/90h Reset Fast Mode XXXh/F0h
Note : The sequence is applied for Word ( x16 ) mode.
53
MBM29PL65LM-90/10
s ORDERING INFORMATION
Part No. MBM29PL65LM90TN MBM29PL65LM10TN Package 48-pin, plastic TSOP (1) (FPT-48P-M19) (Normal Bend) Access Time (ns) 90 ns 100 ns Remarks
MBM29PL65LM
90
TN PACKAGE TYPE TN = 48-Pin Thin Small Outline Package (TSOP(1)) Standard Pinout
SPEED OPTION 90 = 90 ns access time 10 = 100 ns access time
DEVICE NUMBER/DESCRIPTION 64 Mega-bit (8M x 16) 3.0 V-only Page Mode MirrorFlash
54
MBM29PL65LM-90/10
s PACKAGE DIMENSION
48-pin plastic TSOP(1) (FPT-48P-M19) Note 1) * : Values do not include resin protrusion. Resin protrusion and gate protrusion are +0.15(.006)Max(each side). Note 2) Pins width and pins thickness include plating thickness. Note 3) Pins width do not include tie bar cutting remainder.
LEAD No.
1 48
INDEX
Details of "A" part
0.25(.010)
0~8
0.600.15 (.024.006)
24
25
20.000.20 (.787.008) * 18.400.20 (.724.008)
* 12.000.20
(.472.008) 1.10 -0.05
+0.10 +.004
.043 -.002 (Mounting height)
0.50(.020)
"A"
0.10(.004)
0.17 -0.08 .007 -.003
C
+0.03 +.001
0.100.05 (.004.002) (Stand off height) 0.220.05 (.009.002) 0.10(.004)
M
2003 FUJITSU LIMITED F48029S-c-6-7
Dimensions in mm (inches) Note : The values in parentheses are reference values.
55
MBM29PL65LM-90/10
FUJITSU LIMITED
All Rights Reserved. The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before ordering. The information, such as descriptions of function and application circuit examples, in this document are presented solely for the purpose of reference to show examples of operations and uses of Fujitsu semiconductor device; Fujitsu does not warrant proper operation of the device with respect to use based on such information. When you develop equipment incorporating the device based on such information, you must assume any responsibility arising out of such use of the information. Fujitsu assumes no liability for any damages whatsoever arising out of the use of the information. Any information in this document, including descriptions of function and schematic diagrams, shall not be construed as license of the use or exercise of any intellectual property right, such as patent right or copyright, or any other right of Fujitsu or any third party or does Fujitsu warrant non-infringement of any third-party's intellectual property right or other right by using such information. Fujitsu assumes no liability for any infringement of the intellectual property rights or other rights of third parties which would result from the use of information contained herein. The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for use accompanying fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for use requiring extremely high reliability (i.e., submersible repeater and artificial satellite). Please note that Fujitsu will not be liable against you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the prior authorization by Japanese government will be required for export of those products from Japan.
F0312 (c) FUJITSU LIMITED Printed in Japan


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